AEP Technology Inc. announces World's First Universal 3D Surface Profilometer

FOR IMMEDIATE RELEASE
Santa Clara, California, United States of America (Free-Press-Release.com) November 27, 2010 -- Do you ever wonder which technique to use for surface profiling— Contact or noncontact profilometer. Both techniques have been around for 30 years and yet both cannot replace each other. They are complementing techniques.

AEP Techology, a Silicon Valley High tech manufacturer announces - NanoMap-D, Worlds only, next- generation advanced Universal Surface Profilometer which can accommodate BOTH 3D optical surface profilometer and 3D scanning contact profilometer on same tester.Both complementing techniques on same platform opens the window to analyze any kind of sample with ease and reliability. Automatic ease of switching both heads and easy software makes this system very potent and versatile.

In addition to being so versatile and easy to use, NanoMap-D generates 2 million pixel + image with sub nm resolution. This tester is primarily used to calculate surface roughness, defects, volume wear, surface profile, film thickness, step height, film stress etc.

For more inquiry please visit us at www.aeptechnology.com or email us at info@aeptechnology.com

Contact Profilometer     Optical Profilometer     profiler     Profilometer     Surface profilometer     Surface Roughness