Free Keithley Web-Based Seminar Explores Source Measurement Instrumentation

FOR IMMEDIATE RELEASE
Cleveland, Ohio, United States of America (Free-Press-Release.com) February 17, 2012 --

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “What is an SMU Instrument, and How Do You Decide Which One is Right for Your Application?” on Thursday, February 23, and on Thursday, March 1. This one-hour seminar will address how source measurement unit (SMU) instruments work, describe key features and capabilities to consider when selecting them, and compare the performance of various SMU instruments in “real-world” applications. To register for this event, visit http://www.keithley.com/events/semconfs/webseminars.

Keithley has long been an industry pioneer in the design of SMU instruments, continuously developing new capabilities that boost test productivity, deliver more complete characterization, and increase overall test system performance. The popularity of these instruments has increased rapidly as more people discover that their tightly integrated DMM and precision power supply capabilities can serve a wide variety of applications throughout the electronics and semiconductor industries. However, to obtain the optimum productivity, system builders must evaluate instrument specifications carefully in order to choose the most appropriate SMU for a specific application.

This seminar is recommended for engineers, researchers, educators, and students working with semiconductor-based devices, components, materials, and technologies with current vs. voltage (I -V) characteristics that must be verified and/or better understood. Typical devices and technologies include traditional silicon, compound semiconductors (such as silicon carbide and gallium nitride) for power/energy applications like HBLEDs and solar cells, electronic components, nanotechnology, and new materials like graphene, a single-atomic-layer-thick crystal of carbon that can exist at room temperature.

Lishan Weng, the seminar presenter, is an applications engineer at Keithley Instruments, Inc. in Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Weng is interested in new measurement instruments/techniques related to graphene. She holds master’s degrees in both electrical engineering and physics from Purdue University, where her research focused on graphene devices and p-type GaAs/AlGaAs heterostructures. Her previous research also includes carbon nanotube based nanolithography and tunable graphene oxidation, as well as quantum transport measurement and a specialization in AFM lithography.

For More Information
To register to participate in the online seminar, scheduled for Thursday, February 23, at 2:00 PM EST (19:00 UTC/GMT) and on Thursday, March 1, at 9:00 AM EST (14:00 UTC/GMT), visit http://www.keithley.com/events/semconfs/webseminars. To learn more about Keithley, contact the company at:
Telephone: 888-534-8453
440-248-0400
FAX: 440-248-6168
E-mail: publisher@keithley.com

Internet: http://www.keithley.com

Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.

Products and company names listed are trademarks or trade names of their respective companies.

# # #

Electrical Test     Electrical Test Equipment     keithley instruments     source measurement instruments     source measurement unit     webinar